Engineer at Simpson Gumpertz & Heger Inc., NYC, USA
I am a Ph.D candidate developing methods for the local identification of material properties using full-field measurements. Full-field displacement measurement based on X-ray tomography or digital camera techniques provides a rich amount of kinematic information in comparison to standard strain gauge techniques. More than one parameter at various locations can be estimated with a single experiment, by taking advantage of ever increasing computing power and robust identification methods. Our accomplishments include the development of a full-field measurement based identification method in that is robust to current problems in identification such as non-uniqueness and is capable of processing large data obtained from full-field measurements.